Welcome to Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI) 2014!

Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI)September 2nd – 5th, 2014, EPOCHAL TSUKUBA Tsukuba, Japan

Information

Submission

Registration

NEWS

Aug 25, 2014
Presentation Program (final version) is uploaded.
Aug 19, 2014
Presentation guideline is uploaded.
Presentation Program is updated.
Aug 4, 2014
Presentation Program is open.
July 14, 2014
Symposium Tour registration is open. Please register before July 31,2014, Japan Standard Time (GMT+9).
Young researchers' meeting registration is open.
July 10, 2014
Information about Symposium tours and Young researcher's meeting are uploaded on Program page and Registration page
July 9, 2014
Industry Exhibition page is open
March 24, 2014
Abstract confirmation date is changed to April 15, 2014
Proceedings submission deadline is changed to May 31, 2014
February 14, 2014
Abstract deadline is extended to March 15, 2014
October 31, 2013
Abstract submission is open
October 31, 2013
Download Call for papers of LMPMI 2014

more

Date and Venue

September 2nd - 5th, 2014
International Congress Center (EPOCHAL TSUKUBA) Tsukuba, Japan

Scope

The objective of this symposium is to gather scientists and engineers working in the field of laser metrology and provide a forum for discussion for exchanging points of view and experience and sharing research results through high quality peer reviewed papers. It targets the broad area of lasers and optical metrology with applications ranging from macro and micro to nano-engineering. These include specific applications in aerospace, automotive and transport, medical, photonics, manufacturing and defense. We invite you to make your plans to attend the technical and the social programs of LMPMI 2014 and have a memorable stay in Science City Tsukuba.

Topics of the conference includes

1.
Laser Based Dimensional Measurement
2.
Precision Optical Metrology
3.
Active Vision/Metrology
4.
Micro-Meso-Nano-Metrology
5.
Thin Film Metrology
6.
Ultrafast Laser Metrology
7.
Spectroscopy and Spectral Metrology
8.
Photomechanics
9.
Holographic and Speckle Techniques
10.
Laser-Based-Non-Destructive Testing
11.
Shape Measurement / Reverse Engineering
12.
Resolution Enhancement Techniques
13.
Interferometric and Diffractive Methods
14.
Optical Measurement Standards and Calibration

Important Dates

1st Call for papers: October 31, 2013
Abstract submission deadline: March 15, 2014
Abstract acceptance confirmation: April 15, 2014
Proceedings submission starts from: April 15, 2014
Proceedings submission deadline: May 31, 2014
Early registration: Before June 30, 2014

Registration fees

Before June 30 July 1 to Aug. 22 On-site
Full registration Fee 55,000 JPY 65,000 JPY 70,000 JPY
Extra manuscript 40,000 JPY 40,000 JPY 40,000 JPY
Accompanying person 25,000 JPY 25,000 JPY 25,000 JPY

Important Dates

On-line registration:
August 22,2014
Symposium tour registration:
July 31, 2014
Early registration:
June 30, 2014
Proceedings deadline:
May 31, 2014

Web Page Download

11th IMEKO Symposium
LMPMI 2014 PDFpdf

organized by

Intelligent Nano-Measure

Technical Committee for Intelligent Nano-Measure, JSPE

NMIJ

National Metrology Institute of Japan(NMIJ, AIST)

In association with

IMEKO

International Measurement Confederation (IMEKO) Technical Committee TC14 Measurement of Geometrical Quantities, IMEKO

In cooperation with

JSPE

The Japan Society for Precision Engineering (JSPE)

JOMIM

Japan Optical Measuring Instruments Manufacturers Association

JMA

Japan Precision Measuring Instruments Manufacturers Association

JSPE

JSPE Research Affiliates

Supported by

NSK Foundation for the Advancement of Mechatronics (NSK-FAM)

The Precise Measurement Technology Promotion Foundation

Tsukuba Tourist and Convention Association

Tsukuba EXPO' 85 Memorial Foundation

NMIJ

The New Technology Development Foundation